MPW Additional Services
Get more from your MPW run
New additional services are now available on selected MPW runs, giving you more flexibility to test, analyse and extend the value of your fabricated devices.
Available on selected MPW platforms
These options can be selected during the MPW sign-up process and will be added to your quote.
Please note: Additional Services are available on selected MPW platforms and are subject to technical assessment and acceptance. Any additional process steps must be compatible with the relevant MPW process flow and PDK.
SEM and FIB analysis is charged according to actual usage time. Higher-risk process additions may require a dedicated wafer. More complex developments involving significant process changes may be better suited to bespoke fabrication.
All costs are exclusive of VAT.
Additional Dies
Add up to 10 additional dies to your MPW run for expanded testing, characterisation or distribution.
Cost: Half the original MPW cost
SEM Analysis
High-resolution surface imaging to verify critical dimension specifications.
Cost: £950
FIB Analysis
Focused Ion Beam inspection/cross-section analysis for 2 points.
Cost: £1,250
Wafer-Scale Testing
Optical characterisation at wafer level, helping you assess device performance before dicing.
Cost: £1,860
No Cladding
For selected SiN platforms only, opt for a no-oxide-cladding process where required.
Cost: £1,790
Need something else?
Looking for an additional process step that isn’t listed here? Talk to the CORNERSTONE team, we may be able to help.
Ready to Start?
Our new Customer Portal makes managing your MPW submission simple.
Once you’ve chosen your MPW call, simply complete the MPW Sign-Up Form as usual. Our team will then send you login details for your Customer Portal, where you can review your quote and submit your design file via a straight forward dashboard.